The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 11, 2001

Filed:

Feb. 09, 1999
Applicant:
Inventors:

Ryutaro Yamanaka, Yokohama, JP;

Hidetoshi Suzuki, Yokohama, JP;

Hideyuki Kabuo, Kyoto, JP;

Minoru Okamoto, Suita, JP;

Kevin Mark Stone, Lafayette, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/100 ;
U.S. Cl.
CPC ...
G06F 1/100 ;
Abstract

Two path metrics (PM,, PM,) are read from path metric storing means,, and two path metrics (BM,, BM,) are read from branch metric storing means,. An ACS operation is executed using PM,+MB,and PM,+BM,by comparing means,, adding means,, comparison result storing means,, and selecting means,. In parallel with the ACS operation, an ACS operation is executed using PM,+MB,and PM,+BM,by comparing means,, adding means,, comparison result storing means,, and selecting means


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