The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 11, 2001
Filed:
Mar. 12, 1999
Applicant:
Inventor:
Takeshi Yasuda, Tokyo, JP;
Assignee:
Mitsubishi Denki Kabushiki Kaisha, Tokyo, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 7/60 ; G06F 1/710 ;
U.S. Cl.
CPC ...
G06F 7/60 ; G06F 1/710 ;
Abstract
Specific parameters used for calculation of a worst-case parameter can be readily selected. Parameters not suitable for characteristic-value expression are eliminated from principal parameters (step ST,), and model equations are extracted (step ST,). Then, parameter values extracted from the same chip are inserted into the model equations to calculate the characteristic value (step ST,). A correlation coefficient between the calculated and measured characteristic values are obtained (step ST,) to select specific parameters (step ST,).