The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 11, 2001
Filed:
Jan. 21, 1999
Russell L. Kerschmann, San Francisco, CA (US);
Michael E. Bolles, San Francisco, CA (US);
Andrew D. Hendrickson, San Francisco, CA (US);
Resolution Sciences Corporation, Corte Madera, CA (US);
Abstract
A method and apparatus for monitoring and evaluating the performance and condition of histology laboratory microtomes and microtome accessories including knives, motor drives, and illumination devices. Irregularities in an image of the surface of a block mounted on the microtome are detected and characterized, the block having been subjected to mechanical sectioning by the microtome to produce a cut block face. The image of light reflected from the surface of the block, either specular or non-specular, is recorded and subjected to graphical analysis to extract, quantify, and interpret patterned features, including those indicating anomalies in the function of the microtome, its accessories, or the tissue block itself.