The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 11, 2001

Filed:

May. 24, 1999
Applicant:
Inventors:

Thomas Young Chang, San Jose, CA (US);

Shanlin Duan, Fremont, CA (US);

Terence Tin-Lok Lam, San Jose, CA (US);

Wai C. Leung, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 2/736 ;
U.S. Cl.
CPC ...
G11B 2/736 ;
Abstract

The hard disk testing and certifying device of the present invention includes a spin stand to rotate a disk to be tested. A single read/write head, including both a write head and a read head is mounted upon an armature which movably supports the read/write head. The device includes a computerized control system and signal processing system that provides write signals to the write head and receives and processes read head signals from the read head. In the preferred embodiment the read/write head simultaneously provides write signals to the disk and receives read signals from the disk. Preferably, the read/write head functions continually and the certification testing is conducted utilizing a spiral path. In the preferred read/write head the read head is disposed behind the write head and an electromagnetic field shield is disposed between them to reduce electromagnetic field interference between the write head and the read head during simultaneous operation. The read/write head may also include an electromagnetic field interference element to further reduce signal interference at the read head.


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