The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 11, 2001
Filed:
Apr. 07, 2000
Klaus Hermanns, Asslar, DE;
Leica Microsystems Wetzlar GmbH, Wetzlar, DE;
Abstract
The invention relates to a microscope eyepiece with theoretically reduced astigmatism in a compensating optical system. The inventive eyepiece has 10× magnification, a sight field (SFZ)≦25 and a Petzval sum (SP) of 0.014≦SP≦0.021. Said eyepiece comprises a special field lens placed in front of a field stop and a negative lens in the eye lens section placed behind said field stop. The inventive field lens is embodied in the form of a simple, thick, positively diffracting meniscus which is convex in relation to the field stop and provided with the following field lens factor: 0.95≦beta′≦1.05. The eye lens section can be displaced in relation to the field stop to enable diotropic adjustment. Special, advantageous embodiments of the field lens and examples of embodiments of the microscope eyepiece, complete with structural data, are described.