The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 11, 2001

Filed:

Feb. 09, 2001
Applicant:
Inventor:

Ronald J. Rieder, Medford, MA (US);

Assignee:

SatCon Technology Corporation, Cambridge, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 ;
U.S. Cl.
CPC ...
G01B 9/02 ;
Abstract

A high speed, highly sensitive optical sensing platform and a method for detecting and/or measuring characteristics of a substance in a measurement sample are disclosed. The platform includes at least one pair of optical paths formed in a waveguide, a light source for injecting optical beams along the optical paths, a light modulator for enabling the excitement of a transverse electric and a transverse magnetic guide modes, and a phase detector for detecting phase differences between the beams propagating along the optical paths. One of the optical paths has a target analyte of unknown concentration with a measurement sample bound to its upper surface, while the second optical path has a reference sample containing a known concentration of the target analyte bound to its upper surface. A guided mode modulator causes an optical beam to propagate through the waveguide sequentially as two polarized modes. The highly sensitive platform is especially useful for directly detecting and/or measuring very small numbers of small molecules, bio-molecules, microorganisms in a liquid or gaseous test sample.


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