The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 11, 2001
Filed:
Oct. 30, 1998
Daniel P. Timm, Colorado Spring, CO (US);
Agilent Technologies Inc., Palo Alto, CA (US);
Abstract
Spurious artifacts in intensity emulation caused by measurement non-linearities within a statistically created raster display are reduced or eliminated by first characterizing the non-linearities. Armed with this information the collection of code values in an aperture can be inspected to notice which code values are occurring. M-many out of every n-many instances of a fat code can be replaced by an adjacent code, with a frequency of replacement that is selected to counteract the fatness. In principle, the replacement mechanism could be sensitive to prior events and propagate or distribute corrections across a family of abnormal codes. The idea is to statistically adjust the collection of codes to be closer to what it would be if there were no non-linearities. Different non-linearities may benefit from different strategies for replacement. Certain safeguards may be desirable to prevent making the problem worse rather than better.