The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 11, 2001

Filed:

Jan. 20, 1999
Applicant:
Inventor:

Kaori Mori, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 2/358 ;
U.S. Cl.
CPC ...
H01L 2/358 ;
Abstract

A semiconductor device and a method of manufacturing the semiconductor device which can reduce the number of test processes at the time of full-function test. The semiconductor device connects a pair of pins of a semiconductor chip with a pair of terminals provided in the semiconductor chip by way of a changeover circuit, and controls the changeover circuit according to a control, signal (M_ENA signal) input from the outside of the semiconductor chip, and switches connection between the pair of pins of the semiconductor chip and the pair of terminals provided in the semiconductor chip, and the device includes a switching action test circuit which tests the switching action of the changeover circuit.


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Mori, Kaori. (2001). Semiconductor device able to test changeover circuit which switches connection between terminals (U.S. Patent No. 6329669). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6329669

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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