The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 11, 2001

Filed:

Aug. 12, 1999
Applicant:
Inventors:

Joseph Lebowitz, Austin, TX (US);

Laura E. Faulk, Austin, TX (US);

Assignee:

Advanced Micro Devices, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C23F 1/00 ; H01L 2/1302 ; B44C 1/22 ;
U.S. Cl.
CPC ...
C23F 1/00 ; H01L 2/1302 ; B44C 1/22 ;
Abstract

Methods of removing resist residues from semiconductor workpiece surfaces are provided. In one aspect, a method of removing resist from a surface of a workpiece is provided that includes the steps of exposing the workpiece to a plasma and rinsing the workpiece with CO,and water in a processing chamber to dissolve the resist. Reliance on post plasma strip solvent rinses for resist removal is eliminated. The combination of CO,with post-plasma strip water rinse increases the solubility and thus the removal rate of resist residues.


Find Patent Forward Citations

Lebowitz, Joseph. (2001). Residue removal by co2 water rinse in conjunction with post metal etch plasma strip (U.S. Patent No. 6328905). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6328905

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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