The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 11, 2001

Filed:

Nov. 30, 1999
Applicant:
Inventors:

Elmer Hung, Foster City, CA (US);

Andrew A. Berlin, San Jose, CA (US);

Feng Zhao, Campbell, CA (US);

Assignee:

Xerox Corporation, Stamford, CT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01P 1/500 ; G01D 2/100 ; H01H 5/700 ;
U.S. Cl.
CPC ...
G01P 1/500 ; G01D 2/100 ; H01H 5/700 ;
Abstract

A bistable sensor with a tunable threshold for use in microelectromechanical systems. The sensor uses electrostatic force to modify the threshold and to disable the sensor in a deflected position once a sustained extreme in vibration is detected. Potential applications include mechanical implementations of signature analysis to automatically eliminate large amplitude noise at a specific frequency, shock detection without requiring quiescent DC power consumption, and determination of the magnitude of a shock.


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