The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 04, 2001

Filed:

Jun. 08, 1999
Applicant:
Inventors:

J. Bradley Chen, Seattle, WA (US);

Brian N. Bershad, Seattle, WA (US);

Assignee:

Appliant Corporation, Seattle, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/45 ;
U.S. Cl.
CPC ...
G06F 9/45 ;
Abstract

A method and system for identifying sets of instructions within a computer program, execution of which serve as an indicator for processing of a transaction by the computer program and that together comprise a witness set. The witness set may be employed to monitor execution of the computer program and detect processing of the transaction. Witness sets are constructed by iteratively filtering an initial set of instructions based on profile data collected during execution of the computer program.


Find Patent Forward Citations

Quick Actions:

Chen, J.. (2001). Method and system for identifying instrumentation targets in computer programs related to logical transactions (U.S. Patent No. 6327700). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6327700

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…