The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 04, 2001
Filed:
Dec. 28, 1999
Thomas L. Toth, Brookfield, WI (US);
Steven J. Woloschek, Franklin, WI (US);
GE Medical Systems Global Technology Company, LLC, Waukesha, WI (US);
Abstract
In one embodiment of the present invention, a method is provided for analyzing performance of tracking control loop in a CT imaging system configured to position an x-ray beam using the tracking control loop. The method includes the steps of collecting control loop data over a plurality of views during scanning and of evaluating control loop data relative to the corresponding views to measure at least one imaging system characteristic. This method provides the imaging system user with data that facilitates insight into possible causes for imaging artifacts. In another embodiment, a CT imaging system is provided including a tracking control loop. The CT imaging system is configured to position an x-ray beam using the tracking control loop, collect control loop data over a plurality of views during scanning and evaluate control loop data relative to the corresponding views to measure at least one imaging system characteristic.