The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 04, 2001
Filed:
Dec. 21, 1998
Chien-Jen Chen, Edison, NJ (US);
Alexei N. Pilipetskii, Colts Neck, NJ (US);
Ekaterina A. Golovchenko, Colts Neck, NJ (US);
TyCom (US) Inc., Morristown, NJ (US);
Abstract
A method and apparatus is provided for monitoring an optical transmission path through an optical transmission system supporting bidirectional communication between first and second terminals along first and second optical transmission paths. The first transmission path includes at least one optical amplifier located therein. In accordance with the method, a test signal is generated, which is formed by a superposition of first and second optical tones located at first and second wavelengths, respectively. The first and second wavelengths are within the bandwidth of the optical amplifier. The amplitude and phase of the first and second optical tones are arranged so that the test signal has a substantially constant intensity over a modulation cycle of the first and second optical tones. The test signal is transmitted from the first terminal along the first optical transmission path and through the optical amplifier. A portion of the test signal is received at the first terminal after it traverses the optical amplifier, an optical loop-back path, and a second transmission path. The received portion of the test signal may be compared to a delayed rendition of the generated test signal to assess transmission path performance.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile