The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 04, 2001
Filed:
Apr. 08, 1998
Applicant:
Inventors:
Yasushi Namii, Hachioji, JP;
Toyoharu Hanzawa, Mitaka, JP;
Assignee:
Olympus Optical Co., Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 2/122 ; G02B 2/100 ;
U.S. Cl.
CPC ...
G02B 2/122 ; G02B 2/100 ;
Abstract
A stereoscopic microscope comprising a uniaxial optical system consisting of an objective lens system and a vari-focal optical system which is coaxial with the objective lens system, and at least a pair of observation optical systems, wherein right and left optical axes of the observation optical systems pass through locations different from that of an optical axis of the uniaxial optical system and wherein the uniaxial optical system comprises a positive lens component made of an extraordinary dispersive optical material.