The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 04, 2001

Filed:

May. 01, 2000
Applicant:
Inventors:

Toshiaki Mizuno, Aichi, JP;

Yoshinori Matsuyama, Aichi, JP;

Masahiko Kobayashi, Aichi, JP;

Assignee:

Nidek Co., Ltd., Aichi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B24B 9/14 ;
U.S. Cl.
CPC ...
B24B 9/14 ;
Abstract

An eyeglass-frame-shape measuring device for measuring a lens frame shape of an eyeglass frame has a holding mechanism for holding the frame in a predetermined condition, a feeler movable while being kept in contact with a frame groove of the frame held by the holding mechanism, a measuring mechanism for obtaining information (rn, &thgr;n) on radius vector of the frame based on an amount of movement of the feeler, a moving mechanism having a first motor for moving the feeler in a direction of the radius vector of the frame, and a control mechanism for variably controlling driving of the first motor during measurement based on the information on the radius vector obtained by the measuring mechanism.


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