The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 04, 2001

Filed:

Apr. 28, 1999
Applicant:
Inventors:

Kee-Hoon Kang, Daejeon, KR;

Chang-Ho Song, Daejeon, KR;

Yong-Gyoo Kim, Daejeon, KR;

Kee-Sool Gam, Daejeon, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/518 ; F25J 3/00 ; G01K 1/100 ;
U.S. Cl.
CPC ...
G01N 2/518 ; F25J 3/00 ; G01K 1/100 ;
Abstract

The present invention relates to a quantitative measuring method of argon impurity contained in high purity oxygen by means of triple point and &ggr;-&bgr; phase transition of oxygen, and also to a cryostat employed in quantitative measuring of argon impurity contained in high purity oxygen.


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