The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 04, 2001

Filed:

Dec. 07, 1999
Applicant:
Inventors:

Akira Nishina, Tokyo, JP;

Tsutomu Kikuchi, Tokyo, JP;

Makoto Tanaka, Tokyo, JP;

Hidetoshi Yoshida, Tokyo, JP;

Tetsuya Kimijima, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 3/04 ; G01N 2/762 ; G01N 3/072 ; H01J 4/902 ;
U.S. Cl.
CPC ...
G01N 3/04 ; G01N 2/762 ; G01N 3/072 ; H01J 4/902 ;
Abstract

There are provided an apparatus for analyzing gases and a gas analyzing method which can securely detect presence and absence of leakage in a short time and which can carry out analyses successively, safely and accurately in a stable state. The apparatus for analyzing gases is provided with sample gas introducing systems (,to,) for introducing a plurality of sample gases selectively, and analyzers (,and,), and also has means (,) for monitoring, when a sample gas under determination is changed over to another sample gas, change in the concentration of the sample gas component introduced before the change over.


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