The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 27, 2001

Filed:

Aug. 24, 2000
Applicant:
Inventors:

Shie Qian, Austin, TX (US);

Hui Shao, Shanghai 200083, CN;

Wei Jin, Shanghai, CN;

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01P 2/102 ;
U.S. Cl.
CPC ...
G01P 2/102 ;
Abstract

A signal analysis system and method for analyzing an input signal acquired from a mechanical system. The mechanical system may include at least one rotating apparatus. The signal analysis system may be configured to: (a) receive samples of the input signal, (b) perform an invertible joint time-frequency transform (e.g. a Gabor transform) on the samples of the input signal to produce a first array of coefficients which depend on time and frequency, (c) compute an instantaneous rotation frequency signal, (d) select first coefficients from the first array which correspond to one or more order components in the input signal, i.e. one or more multiples of the instantaneous rotation frequency signal, (e) generate a time domain signal from the first coefficients, and (f) present the time domain signal to a user on a presentation device. The signal analysis system may generate the time domain signal from the first coefficients by performing an inverse joint time-frequency transform on the first coefficients.


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