The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 27, 2001

Filed:

Feb. 26, 1999
Applicant:
Inventors:

Henry M. Beisner, Rockville, MD (US);

Arthur J. Dorsey, Gaithersburg, MD (US);

Timothy C. Parker, Vienna, VA (US);

Assignee:

Lockhead Martin Corporation, Gaithersburg, MD (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
G06F / ;
Abstract

A method for measuring the effectiveness of a wide-area differential global positioning system by projecting the least-squares error covariance of the space vehicles and ground reference stations through the central control station. Through generation of the differential corrections at the central control station, the space vehicle-ground reference station error covariance is then projected onto the wide-area differential global positioning system user locations. A covariance analysis approach is then used to capture the dependencies of the space vehicle and observability of the space vehicle by the ground reference stations and to the user locations within the wide-area differential global positioning system coverage area.


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