The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 27, 2001
Filed:
Oct. 06, 2000
Applicant:
Inventors:
Jan Timmer, Eindhoven, NL;
Jantje Edith Wilting, Eindhoven, NL;
Assignee:
U.S. Philips Corporation, New York, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/00 ;
U.S. Cl.
CPC ...
A61B 6/00 ;
Abstract
A cross-sectional distribution along a cutting plane is derived from an object data set of data values. The cross-sectional distribution comprises density values. The density values are calculated from data values of the object data set in positions outside the cutting plane. The object data set represents an object to be examined and is, for example, acquired by way of volumetric computed tomography or magnetic resonance imaging. For example, the density values of the cross-sectional distribution are calculated by local (slab) MIP or mIP or by interpolation.