The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 27, 2001
Filed:
Mar. 18, 1997
Forskningscenter Riso, Roskilde, DK;
Abstract
A method and an apparatus are provided for the determination of a condition or state of an object based on quasi-elastic interaction between the object and light transmitted to the object. This light is transmitted from a light source through a diffractive optical element. The light that has interacted with the object is collected and detected. The diffractive optical element is designed in such a way that the determination of the condition or state of the object is substantially exclusively defined by the diffractive optical element and substantially independent of properties of the light source. Several diffraction patterns may be integrated in one diffractive optical element, thereby integrating several optical functions, such as lenses, beam splitters, etc. in one optical component. Use: Transit-time-velocity measurement, Doppler velocity measurement, viscoelastic measurement, differential speckle determination, differential vibrometer, distance determination apparatus, etc.