The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 27, 2001

Filed:

Nov. 02, 2000
Applicant:
Inventors:

Adam J. Whitworth, Sunnyvale, CA (US);

Dominick Richiuso, Saratoga, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03K 1/716 ; H02H 9/00 ;
U.S. Cl.
CPC ...
H03K 1/716 ; H02H 9/00 ;
Abstract

An active termination circuit for protecting a node against an ESD voltage spike is described. The ESD protection circuit includes a bottom ESD protection transistor having a first node coupled to a first potential and a bottom ESD protection transistor intrinsic diode reverse biasedly coupling said node to a first reference voltage supply and a bottom threshold reference transistor coupled to the first reference voltage supply. The bottom threshold reference transistor provides a first bias voltage to the bottom ESD protection transistor gate that biases the bottom clamping transistor gate at about a first threshold voltage from the first reference voltage representing a threshold voltage of said bottom ESD protection transistor. The circuit also includes a top ESD protection transistor having a second node coupled to a second potential and a top ESD protection transistor intrinsic diode reverse biasedly coupling the node to a second reference voltage supply and a top threshold reference transistor coupled to the second reference voltage supply. The top threshold reference transistor provides a second bias voltage to the top ESD protection transistor gate that biases the top clamping transistor gate at about a second threshold voltage below the second reference voltage that represents a threshold voltage of said top ESD protection transistor.


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