The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 27, 2001

Filed:

May. 21, 1999
Applicant:
Inventors:

Xiaohong Zhou, Houston, TX (US);

Joseph K. Maier, Milwaukee, WI (US);

Steven J. Huff, Hartland, WI (US);

Hammond Glenn Reynolds, Milwaukee, WI (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/00 ;
U.S. Cl.
CPC ...
G01V 3/00 ;
Abstract

A technique is provided for generating images on an MRI system in which errors due to gradient pulses are compensated. The errors are identified in advance, such as in a calibration sequence performed on the MRI system. Receiver phase adjustment and logical gradient error values are derived from the identified error values. The calibration sequence may be a modified version of the MRI imaging sequence used to produce the images. The correction values may be based upon corrections at the center of k-space. The technique is particularly useful in compensating for effects of eddy currents in pulse sequences employing high slew rate gradient pulses, such as diffusion weighted echo planar imaging sequences.


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