The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 27, 2001
Filed:
Sep. 03, 1999
Toshimitsu Morooka, Chiba, JP;
Akikazu Odawara, Chiba, JP;
Seiko Instruments Inc., , JP;
Abstract
A superconducting quantum interference device is provided which can accurately measure only a magnetic field detected by a detection coil where the superconducting quantum interference device is used for a fluxmeter. A superconductor for enclosing a loop to be formed by a washer coil is formed at an upper portion or lower portion of the washer coil. Otherwise, a ground plane layer is formed with an interlayer insulation film sandwiched, in a position, except for a detection coil, particularly, of an upper layer or lower layer, of a washer coil being magnetically coupled to a feedback-modulation coil to which a signal is sent from an external control system. As a result, it is possible to prevent an external magnetic field from being coupled to other regions than the detection coil and hence accurately measure a magnetic field linked to the detection coil. In particular, the invention is effective for a reduced detection area of a detection coil thus suited for measurement on high spatial resolution.