The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 27, 2001
Filed:
Jan. 03, 2000
Applicant:
Inventors:
Hirofumi Yanagita, Tokyo, JP;
Masatake Nukui, Tokyo, JP;
Assignee:
GE Yokogawa Medical Systems, Limited, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/08 ;
U.S. Cl.
CPC ...
A61B 6/08 ;
Abstract
In order to make an X-ray impinging position coincide with a fixed position from the beginning of a scan, in scanning a subject to be examined by an X-ray emitting/detecting apparatus, an X-ray focus position is predicted based on the temperature of an X-ray tube,prior to beginning the scan and scan conditions intended to be currently used, and the position of a collimator,or an X-ray detector,is adjusted so that the X-ray impinges upon a fixed position on the X-ray detector
Yanagita, Hirofumi. (2001). X-ray impinging position alignment method and x-ray tomographic imaging method and apparatus (U.S. Patent No. 6322248). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6322248
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile