The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 20, 2001

Filed:

Dec. 03, 1998
Applicant:
Inventors:

Kouji Izaki, Hadano, JP;

Tetsuya Takahashi, Hadano, JP;

Ryo Yamagata, Sagamihara, JP;

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 3/128 ;
U.S. Cl.
CPC ...
G01R 3/128 ;
Abstract

An LSI having a logic circuit and a test circuit is provided with a first register which is connected between an LSI input/output pin and the logic circuit and has a first input terminal to be outputted from the first register in accordance with a system clock signal and a second input terminal, a second register which has a first input terminal inputted with an output of the first register and a second input terminal inputted with scan-in data and an output of which is connected to the second input terminal of the first register, a selector circuit which is connected to one of the first input terminal of the second register and the second terminal of the first register and selects one of a signal relating to scan-out data and an output signal of the other register so that the selected signal is inputted to the one input terminal, and a third register which receives an output of the second register and provides the received output as scan-out data in accordance with another clock signal. An output of the third register is successively provided to another LSI input/output pin. The selector circuit includes a logic gate circuit inputted with a signal indicative of an LSI test mode and the output signal of the other register.


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