The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 20, 2001
Filed:
Aug. 05, 1999
Applicant:
Inventors:
Russell N. Evans, Louisville, CO (US);
Terry X. Beachey, Longmont, CO (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01F 1/46 ;
U.S. Cl.
CPC ...
G01F 1/46 ;
Abstract
A differential pressure measuring probe with an improved signal to noise ratio is provided. The probe includes an slit surface with at least one longitudinally extending impact aperture communicating with a first plenum within the body of the probe. The width of the aperture is selected to be less than the width of the interior portion of a first plenum. A non-impact surface is provided with non-impact apertures to measure a second pressure such that differential pressure between the impact surface and the non-impact surface can be measured.