The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 20, 2001
Filed:
May. 14, 1999
J. Andrew Derbyshire, Baltimore, MD (US);
General Electric Company, Waukesha, WI (US);
Abstract
A method is provided for estimating or determining the linear phase shift of an MR signal pertaining to an object of interest. In accordance with the method, an MR sequence is applied to the object, to acquire a set of MR data samples in a specified domain, such as the time domain, the acquired data samples having an associated linear phase shift. A set of conjugate data samples is generated from the acquired data samples, in a domain conjugate to the specified domain such as the frequency domain. The linear phase shift is then determined from the conjugate data samples, by means of computations which are executed exclusively in the conjugate domain. The efficiency of such computations is comparable to the efficiency of the Ahn algorithm. The resultant linear phase shift is employed to reduce artifacts in constructing an MR image of the object, in connection with an MR technique such as navigator echo, or multi-echo imaging.