The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 20, 2001
Filed:
Mar. 08, 1999
Michael E. Farey, Oceanside, CA (US);
Richard A. Chodzko, Rancho Palos Verdes, CA (US);
TRW Inc., Redondo Beach, CA (US);
Abstract
A system for making small signal gain measurements of a chemical laser, such as an HF or DF laser. The system is adapted to measure the two dimensional (x,y) gain distribution in real time (i.e. 30 to 40 frames per second). The system includes a resonating galvanometer driven scanning mirror which is able to tilt in both the horizontal x and vertical y direction. The scanning mirror is used for scanning the gain profile of an HF/DF probe laser. The tiltable scanning mirror with appropriate optics, allows the laser beam from the probe laser to be scanned while remaining parallel to the nozzle exit plane of the laser and thus allows the two dimensional scanning of the gain distribution in real time (i.e. at rates up to 40 frames per second). As such, the system is adapted to be controlled by a personal computer with the data stored on a hard disk drive therewithin. Another important aspect of the present invention is that the system enables the gain distribution to be measured rapidly at various wavelengths of the chemical laser.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile