The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 20, 2001
Filed:
Jul. 12, 1999
Bryan Kok Ann Ngoi, Singapore, SG;
Krishnan Venkatakrishnan, Singapore, SG;
Other;
Abstract
An apparatus and method for using an acousto optic scanning laser vibrometer for measuring a dynamic parameter of micro and macro components is disclosed. A coherent source of a laser beam of single wavelength and of stabilized frequency is split into two orthogonal polarized beams. One of the beams strikes the surface of investigation and gets reflected back, and the other polarized beam impinges on the reference surface and gets reflected back. The beam reflected from the surface of investigation and the beam from the reference surface are combined, thereby causing them to interfere. At least one photo detector is positioned at the point of interference. The photo detector output signals are input to a signal processor or phase meter to obtain the dynamic parameter information. Information is provided that is based on the phase shift between the beam striking on the object of investigation and the beam striking the reference surface due to the difference in the optical path. The information provided relates to the dynamic parameters of the object under investigation.