The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 20, 2001
Filed:
Jun. 22, 1998
Aperture grille having parallel slits with larger cross-sectional area grids at a peripheral portion
Applicant:
Inventors:
Akira Mikita, Tokyo, JP;
Yasuhiko Ishii, Tokyo, JP;
Assignee:
Dai Nippon Printing Co., Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 2/980 ;
U.S. Cl.
CPC ...
H01J 2/980 ;
Abstract
An aperture grille, in which tensile strength applied on the aperture grille after it is mounted on a frame body is made uniform to eliminate rupture of grid and variations in elongation caused by heat. The width of each slit on a display surface side and a rear side of the aperture grille is constant in longitudinal direction, and the width of each slit on the display surface side is designed smaller on peripheral portion than at the central portion so that cross-sectional area of each grid of the aperture grille is made larger on the peripheral portion than at the central portion.