The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 20, 2001
Filed:
Nov. 14, 1995
Applicant:
Inventors:
Takashi Fukaya, Sagamihara, JP;
Tohru Shinmura, Hachioji, JP;
Koji Yasunaga, Hino, JP;
Kazuo Banju, Hachioji, JP;
Masaaki Ueda, Hachioji, JP;
Tomonori Ishikawa, Hachioji, JP;
Hiroshi Fujiwara, Hachioji, JP;
Masanori Kaneda, Hachioji, JP;
Junichi Nozawa, Hachioji, JP;
Assignee:
Olympus Optical Co., Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B85D 8/538 ; B65D 6/502 ; G02B 2/100 ;
U.S. Cl.
CPC ...
B85D 8/538 ; B65D 6/502 ; G02B 2/100 ;
Abstract
A microscope for operation body,having an objective lens,and eyepieces,is combined with a cap that is capable of covering the entire part of the microscope body,and which is made of a sterilizable elastic material such as rubber. A retaining portion,projecting to retain the cap is provided on the microscope body,and a mounting portion engageable with the retaining portion,is provided on the cap.