The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 13, 2001
Filed:
Apr. 24, 1997
Kazunori Hikone, Naka-machi, JP;
Kazumi Hatayama, Hitachinaka, JP;
Takao Nishida, Kokubunji, JP;
Hiromichi Yamada, Hadano, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
An apparatus for providing test data used for detection of defects which occur in manufacturing functional blocks of a processor LSI is provided with a test pattern producing part for detecting a fault of the functional block at a block edge of the functional block, based on logic data of the functional block, with regard to one operation of the processor LSI which operates the functional block for the test data to be produced, the test pattern at the block edge of the functional block being such as to satisfy the conditions of an input signal to the block edge of the functional block when an instruction on the one operation is executed, and the conditions of an output signal from the block edge of the functional block being observable from the outside of the processor LSI when the instruction is executed. The apparatus also has an instruction sequence producing part for producing an instruction sequence in a machine language for the processor LSI by which an output from the block edge of the functional block becomes detectable at an external terminal of the processor LSI.