The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 13, 2001
Filed:
Nov. 28, 2000
Yoshinori Hayashi, Kanagawa-ken, JP;
Atsushi Kawamura, Kanagawa-ken, JP;
Kenichi Takanashi, Chiba-ken, JP;
Ricoh Company, Ltd., Tokyo, JP;
Abstract
A multi-beam scanning apparatus performs image scanning by emitting multiple beams from a plurality of light sources, which beams are deflected by a common deflector at equiangular velocity. The beams are then condensed by a common scanning image forming lens so as to form optical spots on a scanning surface. As a result, the plurality of lines are simultaneously scanned by the beams on the scanning surface at a substantially constant velocity. Characteristics of the light sources, such as the wavelength thereof, and other factors such as writing density and desired writing width of a writing line, are arranged to eliminate differences in a written vertical line in a sub scanning direction caused by a magnification difference, regardless of the cause of such differences. In addition, the modulation frequency of the plurality of light sources is made different from each other so that writing widths of the dots written by the plurality of light sources become the same.