The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 13, 2001

Filed:

Dec. 14, 1998
Applicant:
Inventors:

Peter Rudak, Hilton, NY (US);

Yongchun Lee, Rochester, NY (US);

James M. Stefanko, Rochester, NY (US);

Assignee:

Eastman Kodak Company, Rochester, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 5/50 ; H04N 1/409 ;
U.S. Cl.
CPC ...
G06T 5/50 ; H04N 1/409 ;
Abstract

A digital image processing system applies an edge-based adaptive thresholding technique with different contrast parameters to convert an image into first and second binary images. In the digital processing system of the invention, the first and second binary images are compared and a map of the difference between the first and second binary images is generated. A vertical profile of this map is projected and local peaks in the vertical profile which correspond to a vertical pattern or artifact in the map is detected. Pixels in the first binary image are reversed based on the vertical pattern or artifact in the map. This system is effective in reducing vertical artifacts produced by scanners.


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