The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 13, 2001
Filed:
Dec. 22, 1998
Douglas James Beckett, Kanata, CA;
Ronqqing Hui, Lawrence, KS (US);
Nortel Networks Limited, Quebec, CA;
Abstract
A method and apparatus for measuring the magnitude of multiple path interference (MPI) in a device under test (“DUT”) is disclosed. The DUT preferably forms part of an optical test system. The test system includes a light source, two back reflection paths, an output path, a lightwave signal analyzer and a computer. Before measuring MPI, the back reflection paths are calibrated. The input and output conditions are set and spectral data is collected. The spectral data is integrated to give a value for beat-noise power. The beat-noise power measurement allows generation of a crosstalk power ratio. The crosstalk power ratio is indicative of magnitude of multiple path interference.