The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 13, 2001

Filed:

Mar. 25, 1999
Applicant:
Inventors:

Toshinori Ninoyu, Nagoya, JP;

Kiyoshi Saeki, Okazaki, JP;

Hiroyuki Kishita, Kariya, JP;

Tomoya Uchida, Kariya, JP;

Hideki Saito, Chiryu, JP;

Masahiko Osada, Hekinan, JP;

Assignee:

Denso Corporation, Kariya, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G09G 3/30 ;
U.S. Cl.
CPC ...
G09G 3/30 ;
Abstract

An EL display in which expansion of dielectric breakdown occurring at any one of EL elements is inhibited. Scan electrodes are arranged to receive an offset voltage Vm at those instances other than during application of a scanning voltage thereto in a positive field, while a predetermined voltage is applied to data electrodes to prevent voltage from being applied to EL elements immediately after application of the scan voltage. Accordingly, even where dielectric breakdown occurs at any one of the EL elements due to application of a light emission driving pulse voltage, it is possible to inhibit current flow between the scan electrodes and the data electrodes to thereby inhibit further subsequent dielectric breakdown.


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