The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 13, 2001

Filed:

Dec. 17, 1999
Applicant:
Inventors:

Paul F. Corey, Elkhart, IN (US);

Michael J. Pugia, Granger, IN (US);

Gary E. Rehm, Elkhart, IN (US);

Assignee:

Bayer Corporation, Elkhart, IN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 3/122 ;
U.S. Cl.
CPC ...
G01N 3/122 ;
Abstract

An improved test strip for determining the presence or concentration of unknown or a constituent in a liquid test sample is disclosed. The test strip comprises a support strip and a test pad, wherein the test pad includes a carrier matrix incorporating a reagent composition capable of interacting with the constituent of interest to produce a detectable or measurable response. The test strip further comprises an infrared dye, applied either to the support strip or incorporated into a test pad, which ensures proper alignment of the test strip in an apparatus having a detection system for the detectable or measurable response. The improved test strip reduces the number of erroneous assays for the constituent of interest.


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