The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 13, 2001

Filed:

Mar. 01, 2000
Applicant:
Inventors:

James Hammond Brannon, Palo Alto, CA (US);

Shanlin Duan, Fremont, CA (US);

Wai Cheung Leung, San Jose, CA (US);

Yan Liu, Cupertino, CA (US);

Li Tang, Fremont, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 9/00 ;
U.S. Cl.
CPC ...
G01L 9/00 ;
Abstract

A method and apparatus for precise measurement of pressure dependence of head fly height using transitional thermal signals is disclosed. A slider is positioned relative to a rotating a disk having at least one laser bump. Calibration data is gathered by decreasing the pressure and measuring the fly height until a contact positive TA signal is detected. A non-contact negative TA signal is then normalized using the gathered calibration data. The TA signal amplitude may then be used to ascertain the fly height and pressure for a head.


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