The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 06, 2001

Filed:

Feb. 14, 1994
Applicant:
Inventors:

Peter Höfer, Aschaffenburg, DE;

Peter Hagmann, Hösbach-Bahnhof, DE;

Roland Hauck, Hohenfels, DE;

Wolfgang Geissler, Bad Schönborn, DE;

Hubert Lutz, Niederwangen, CH;

Assignee:

Novartis AG, Basel, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 ; G06T 7/00 ;
U.S. Cl.
CPC ...
G06K 9/00 ; G06T 7/00 ;
Abstract

A process and an apparatus for the examination, especially the quality control, of optical components, in which an image of the particular component to be examined is produced and flaws in the imaged article are detected by image analysis, as well as the integration of that examining process into the manufacture of the component. The optical components may be optical components for the eye, such as spectacle lenses, contact lenses, intraocular lenses and the like.


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