The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 06, 2001
Filed:
Feb. 25, 1998
Applicant:
Inventors:
Anil K. Jain, Okemos, MI (US);
Lin Hong, Lansing, MI (US);
Rudolf Maarten Bolle, Bedford Hills, NY (US);
Sharathchandra Umapathirao Pankanti, Mt. Kisco, NY (US);
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/32 ; G06K 9/36 ;
U.S. Cl.
CPC ...
G06K 9/32 ; G06K 9/36 ;
Abstract
The invention is a system and method for determining alignment parameters (rotation angle and translation vector) between two images of scene based on the attributes of segments associated with a pair of corresponding points, each point extracted from each of the images.
Quick Actions:
Jain, Anil. (2001). Determining an alignment estimation between two (fingerprint) images (U.S. Patent No. 6314197). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6314197
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