The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 06, 2001
Filed:
Jan. 05, 1996
Alan J. Armstrong, Broomfield, CO (US);
Renee E. Wallerius, Freemont, CA (US);
Richard T. Behrens, Louisville, CO (US);
Charles J. Duey, Westminster, CO (US);
Cirrus Logic, Inc., Austin, TX (US);
Abstract
A method and apparatus for calibrating the components of a Partial Response Read Channel (PRML) integrated circuit utilized in a magnetic storage device including a channel quality circuit, incorporated within the read channel IC, for automatically measuring the performance of each component as data is read by the channel. An error measurement for each component is generated as an indicator of the component's performance, such as a sample error generated by measuring the difference between the samples read by the channel and expected samples. The read channel components are programmed over a range of settings to determine the settings that generate the minimum error. By programming the components with settings corresponding to minimum error rates, the read channel is optimized. A programming device incorporated within the magnetic storage device and connected to the read channel IC executes a calibration program when the storage device is manufactured, repaired, and periodically to compensate for changes in the storage device and storage medium that occur over time.