The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 06, 2001
Filed:
Sep. 10, 1999
Steven E. Garvey, Boulder Creek, CA (US);
Andrew D. MacGregor, Boulder, CO (US);
Dataray, Inc., Boulder Creek, CA (US);
Abstract
Apparatus for real time measurement of optical beam parameters includes an assembly of known dimensions, carrying multiple apertures, occupying parallel planes. The assembly can be moved so that the apertures sequentially intersect an optical beam which is not propagated in the plane of the apertures. At least one pair of the apertures are non-circular and identical with accurately established positions and which are not disposed in the same angular alignment when they intercept the beam but are disposed in the same plane in order to allow determination of the two-dimensional position of the centroid of the beam in that plane.