The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 06, 2001
Filed:
Apr. 20, 1999
Ralph Edward Frazee, Jr., Bricktown, NJ (US);
David Harry Smithgall, East Windsor, NJ (US);
Lucent Technologies Inc., Murray Hill, NJ (US);
Abstract
Methods and apparatus for detecting defects, such as air lines, in optical waveguide fibers are provided. The methods and apparatus employ scattered light interference signals produced by a fiber clad measurement system that transversely illuminates a fiber with a laser beam. Defects in the fiber produce characteristic peaks in the frequency spectrum of the scattered light signal. By filtering the scattered light signal to remove (a) the components associated with the fiber clad measurement system and (b) the fundamental component associated with the fiber, the defect-related components in the scattered light signal which represent defects in the associated fiber are determined. Once the presence of these defect-related components is determined, a defect detection output pulse is generated for each such event. The defect detection methods are also incorporated in an overall system for drawing and inspecting the optical lightguide fibers.