The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 06, 2001

Filed:

Oct. 23, 1998
Applicant:
Inventor:

Ronald D. Larson, Fort Collins, CO (US);

Assignee:

Hewlett-Packard Company, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/500 ;
U.S. Cl.
CPC ...
G06F 1/500 ;
Abstract

A method and apparatus is provided for performing Z depth comparison tests in a computer graphics display system. The minimum and maximum Z values are calculated for each region of Z values stored in a Z buffer memory device. When a Z value to be tested is received, the Z value is tested against the maximum Z value to determine whether the primitive is occluded. The maximum Z value corresponds to the largest Z value of a region of Z values. The minimum Z value corresponds to the smallest Z value of all of the Z values of the region. If a determination is made that the primitive is not occluded, the received Z value is tested against the minimum Z value. If a determination is made that the received Z value is less than the minimum Z value, the received Z value is retained and is ultimately stored in the Z buffer memory element. The minimum and maximum Z values are updated using the Z values which are contained in the Z buffer memory element. The depth comparison tests may be performed in a frame buffer controller of a computer graphics display system. The controller may comprise a cache memory element for storing a region of Z values and the maximum and minimum Z values associated with the region used in the depth comparison tests. By using the cache memory device in this manner, the number of reads from the Z buffer memory device is reduced.


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