The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 06, 2001
Filed:
Aug. 11, 1999
Applicant:
Inventors:
Thilo Schaffroth, Röhrmoos, DE;
Florian Schamberger, Bad Reichenhall, DE;
Helmut Schneider, München, DE;
Assignee:
Siemens Aktiengesellschaft, Munich, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/102 ; G01R 3/126 ; H01H 3/102 ;
U.S. Cl.
CPC ...
G01R 3/102 ; G01R 3/126 ; H01H 3/102 ;
Abstract
A method of testing leakage current at a contact-making point in an integrated circuit includes applying a test potential to the contact-making point through an output of an application device. The output of the application device is connected to a high impedance or is isolated from the contact-making point. The potential at the contact-making point is determined as a measure of the leakage current being produced.