The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 06, 2001
Filed:
Jan. 24, 1997
Stanley J. Brooks, Rockvale, TN (US);
Square D Company, Palatine, IL (US);
Abstract
A system for testing an arcing fault detection system in an electrical distribution network having a line conductor carrying an electrical signal between a power source and a load, the arcing fault detection system including a sensor coupled to the line conductor for monitoring the electrical signal and generating a sensor signal representing the electrical signal, the arcing fault detection system generating an arc-indicative signal in response to the sensor signal having characteristics indicative of an arcing fault. The testing system couples the sensor to a test line simultaneously with the line conductor and periodically produces a test signal on the test line. The sensor simultaneously monitors the test signal and the electrical signal and produces a sensor signal representing both the test signal and the electrical signal when the test signal is present on the test line. The arcing fault detection system generates an arc-indicative signal in response to the sensor signal associated with either the test line or line conductor having characteristics indicative of an arcing fault. A diagnostic test integrator evaluates the status conditions of the test signal and the arc-indicative signal and generates a trip signal to trigger the interruption of the electrical signal in response to certain status conditions of the test signal and the arc-indicative signal.