The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 06, 2001

Filed:

Nov. 23, 1999
Applicant:
Inventors:

Xecheng Liu, Solon, OH (US);

Francis H. Bearden, Twinsburg, OH (US);

Assignee:

Picker International, Inc., Highland Heights, OH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/00 ;
U.S. Cl.
CPC ...
G01V 3/00 ;
Abstract

A method of magnetic resonance imaging includes subjecting a number of regions of an object being imaged to a magnetic resonance calibration pulse sequence. Each calibration pulse sequence generates a single calibration echo. Each of the calibration echoes are collected and therefrom correction factors are generated. Thereafter, the method includes subjecting the regions of the object being imaged to a plurality of magnetic resonance imaging pulse sequences. Each of the imaging pulse sequences generates a single imaging echo. Each imaging echo is collected into k-space as a plurality of sampled data points. The plurality of sampled data points are adjusted in accordance with the correction factors as each imaging echo is collected into k-space.


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