The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 06, 2001
Filed:
Jan. 29, 1999
Koichi Nittoh, Yokohama, JP;
Takeshi Takahara, Yokohama, JP;
Yukihiro Fukuta, Yokohama, JP;
Chikara Konagai, Yokohama, JP;
Kabushiki Kaisha Toshiba, Kawasaki, JP;
Abstract
A radiation discriminative measurement is performed by using a radiation discriminative measuring apparatus which comprises a radiation source for radiating radiations, first, second and third scintillators disposed in a region which is irradiated with the radiations radiated from the radiation source, and an image pickup means to deal with the light beams emitted from the first, second and third scintillators and the discrimination measurement includes the steps of arranging the first, second and third scintillators in a region which is irradiated with the radiations radiated from the radiation source, causing the first scintillator to respond to type A, type B and type C radiations radiated from the radiation source and to emit alight beam in a first wavelength region, causing the second scintillator to respond to type B and type C radiations which pass through the first scintillator so as to to emit a light beam in a second wavelength region, and causing the third scintillator to respond to a type C radiation which passes through the third scintillator so as to emit a light beam in a third wavelength region which is different from said first and second wavelength regions. The data of the scintillators are corrected in accordance with the wavelengths and the measurement of radiations according to the type thereof is discriminated and simultaneously measured.