The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 30, 2001

Filed:

Mar. 19, 1999
Applicant:
Inventors:

Ju-Hong Lee, Seoul, KR;

Deok-Hwan Kim, Seoul, KR;

Chin-Wan Chung, Seoul, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 7/00 ;
U.S. Cl.
CPC ...
G06F 7/00 ;
Abstract

Disclosed is a multi-dimensional selectivity estimation method using compressed histogram information which the database query optimizer in a database management system uses to find the most efficient execution plan among all possible plans. The method includes the several steps to generate a large number of small-sized multi-dimensional histogram buckets, sampling DCT coefficients which have high values with high probability, compressing information from the multi-dimensional histogram buckets using a multi-dimensional discrete cosine transform(DCT) and storing compressed information, and estimating the query selectivity by using compressed and stored histogram information as the statistics.


Find Patent Forward Citations

Lee, Ju-Hong. (2001). Multi-dimensional selectivity estimation method using compressed histogram information (U.S. Patent No. 6311181). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6311181

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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